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features

Features

IECUBE-3100 combines the following instruments into a single compact platform:
  • 100Mhz Oscilloscope (2 CH, 1GS/s)
  • 34 Channel Logic Analyzer with SPI/I2C/Parallel Decode
  • 20MHz Arbitrary Waveform Generator
  • 51⁄2Digit Multimeter (up to 300V)
  • Programmable DC Power Supply (6V, ±25V)
  • 8 Channel Digital I/O (TTL)
  • Dual PCI DUT Automatic Test Interfaces
  • Open Breadboard Area for Manual Circuit Testing

Compact DUT Board

ADC Test board

Measures Essential ADC Parameters

  • Static: LSB, FSR, Offset Error, Gain Error
  • Dynamic: SNR, THD, SFDR
DAC Test board

Supports : LSB/FSR, Offset/Gain Error, INL/DNL, Dynamic Distortions

Op-amp DUT Test Board

Evaluates : Offset Voltage, Bias Current, Gain & Frequency Response, CMRR, PSRR

Transistor DUT Test Board

Support : BJT, JFET, MOSFET Testing Input/Output Characteristics, Input/Output Impedance, Transfer Ratio

Digital IC Test Board

Replaceable DIP IC Socket, Timing Analysis, DC/AC Parameter Measurement

Software, Curriculum Integration & Benefits

Integrated Software Ecosystem The IECUBE 3100 software suite includes:

IC Parameter Test and Measurement Software

  • Ready to run experiments
  • Beautiful visualized test curves & data
  • Automatic computation of IC parameters

LabVIEW Development Environment

  • Build custom automated test applications
  • Call oscilloscope, AWG, power supply, logic analyzer directly from VirtualBench APIs

Drivers and Tools

  • IECUBE-3100 Driver • Waveforms auxiliary software